International Scientific Committee 2023
Representing Organisations
61
Sweden
Prof. A. Archenti
KTH
Brazil
Dr C. Assis
Federal Institute of Sao Paulo
Germany
Dr F. Balzer
Hexagon Metrology GmbH
Spain
Dr C. Bermudez
Sensofar
Switzerland
N. Blondiaux
CSEM SA
USA
Dr E. Buice
Lawrence Berkeley National Laboratory
Germany
Dr B. Bulla
son-x GmbH
Denmark
M. Calaon
Technical University of Denmark
UK
Dr S. Catalucci
The University of Nottingham
UK
Prof. K. Cheng
Brunel University
Hong Kong
Prof. B. Cheung
The Hong Kong Polytechnic University
Switzerland
Dr F. Cosandier
EPFL
Belgium
Dr A. Demarbaix
HEPH Condorcet
Belgium
Prof. F. Ducobu
UMONS
Germany
Dr J. Edelmann
Fraunhofer IWU
China
Assist. Prof. X. Feng
Shanghai Jiao Tong University
UK
Prof. A. Forbes
National Physical Laboratory
Spain
Assoc. Prof. J. A. A. Garcia
University of Zaragoza
Polan
Prof. A. Gąska
Cracow University of Technology
Brazil
Assoc. Prof. R. Goulart Jasinevicius
University of São Paulo
USA
Dr R. Grejda
Corning Tropel
China
Prof. J. Guo
Dalian University of Technology
Belgium
Dr H. Haitjema
KU Leuven
Denmark
Prof. H. N. Hansen
Technical University of Denmark
Czech Republic
Dr O. Horejš
Czech Technical University in Prague
UK
Dr D. Huo
Newcastle University
Denmark
Assoc. Prof. A. Islam
Technical University of Denmark
Czech Republic
Dr M. Janota
Czech Technical University in Prague
South Korea
Prof. K. Joo
Chosun University
Croatia
Assist. Prof. E. Kamenar
University of Rijeka
Germany
Jun.-Prof. T. Kissinger
University of Ilmenau
Switzerland
Dr W. Knapp
Engineering Office
Germany
Dr S. Kühne
Technical University Berlin
Germany
Dr. Y. B. P. Kwan
Carl Zeiss SMT GmbH
Singapore
Y. J. Lee
National University of Singapore
China
Y. Li
Fine Optical Engineering Research Center
United Kingdom
Prof. A. Longstaff
University of Huddersfield
United Kingdom
Dr S. Lou
University of Huddersfield
USA
Dr S. Ludwick
Aerotech Inc
UK
Prof. X. Luo
University of Strathclyde
Switzerland
Dr H. Mainand Durand
CERN
Czech Republic
Dr M Mareš
Czech Technical University in Prague
USA
Prof. E. Marsh
Penn State University
Switzerland
Prof. M. Marxer
Ostschweizer Fachhochschule
France
C. Mehdi-Souzani
LURPA – Ecole Normale Paris-Saclay
India
Dr S. Mishra
IIT Kanpur
Japan
Prof. W. Natsu
Tokyo University of Agriculture and Technology
France
Dr H. Nouira
Laboratoire National de Métrologie et d’Essais (LNE)
Germany
Dr A. Olarra
Carl Zeiss SMT
Germany
Dr G. Olea
Huber Diffraction GmbH
Croatia
Dr M. Percic
University of Rijeka
UK
Prof. D. Pham
University of Birmingham
UK
Assoc. Prof. S. Piano
University of Nottingham
Belgium
Dr J. Qian
KU Leuven
Germany
Dr O. Riemer
University of Bremen (LFM)
Poland
Prof. M. Rucki
Kazimierz Pulaski University of Technology and Humanities in Radom
Netherlands
Dr T. Ruijl
MI-Partners BV
Italy
Prof. E. Savio
University of Padua
Italy
Dr E. Sbettega
University of Padua
Germany
Dr H. Scheibe
Carl Zeiss Jena GmbH
Singapore
Dr A. Senthil Kumar
National University of Singapore
Japan
Prof. H. Shizuka
Shizuoka University
UK
Mr S. Smith
Aerotech Ltd
Japan
Dr K. Takamasu
University of Tokyo
Singapore
Dr N. Y. J. Tan
Advanced Remanufacturing and Technology Centre
USA
Dr J.S. Taylor
University of North Carolina at Charlotte
Germany
Prof. R. Theska
Technical University of Ilmenau
UK
Dr A. Thompson
The University of Nottingham
Sweden
Dr R. Tomkowski
KTH Royal Institute of Technology
UK
Dr Z. Tong
EPSRC Future Metrology Hub, University of Huddersfield
Denmark
Assoc. Prof. G. Tosello
Technical University of Denmark
Czech Republic
P. Vavruska
Czech University
Finland
Asst. Prof. R. Viitala
Aalto University School of Engineering
Hong Kong
Dr C. Wang
The Hong Kong Polytechnic University
Singapore
Asst. Prof. H. Wang
National University of Singapore
Spain
Prof. José Yagüe-Fabra
University of Zaragoza
UK
Dr N. Yu
University of Edinburgh
Italy
Dr F. Zanini
University of Padua
Croatia
Prof. S. Zelenika
University of Rijeka
Singapore
J. Zhang
National University of Singapore